Electronic and magnetic properties of hole-doped topological kagome Fe1−xMnxSn thin films
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- Title
- Electronic and magnetic properties of hole-doped topological kagome Fe1−xMnxSn thin films
- Creators
- Rajesh Dutta - Drexel UniversityPrajwal M. Laxmeesha - Drexel University, Philadelphia, PA (United States)Tarush Tandon - Drexel University, Philadelphia, PA (United States)Tessa D. Tucker - Drexel UniversitySharup Sheikh - Temple UniversityUditha M. Jayathilake - Temple UniversityWei Tian - Oak Ridge National LaboratoryAdam A. Aczel - Oak Ridge National LaboratoryTien-Lin Lee - Diamond Light SourceAlexander X. Gray - Temple UniversitySteven J. May - Drexel UniversityDrexel University, Philadelphia, PA (United States)
- Publication Details
- Physical review materials, v 9(7), 074201
- Publisher
- American Physical Society (APS)
- Number of pages
- 8
- Grant note
- U.S. Department of Energy (DOE)Office of Science, Basic Energy Sciences (BES): DE-SC0024204 U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division: DE-SC0024132
This research was primarily supported by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES), under Award No. DE-SC0024204 (neutron scattering, materials synthesis, x-ray and electronic characterization). A portion of this research used resources at the High Flux Isotope Reactor, a DOE Office of Science User Facility operated by the Oak Ridge National Laboratory. The beam time was allocated to VERITAS on Proposal No. IPTS-32816.1. A.X.G., S.S., and U.M.J. acknowledge support from the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division under Award No. DE-SC0024132. The authors would like to thank Hussein Hijazi at Rutgers University for performing timely RBS experiments. The authors thank Bing Li from ORNL for helping with the calculation of instrument resolution for the instrument VERITAS using TAVI. The authors also acknowledge the characterization facilities at MCC of the College of Engineering at Drexel University.
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Web of Science ID
- WOS:001531359300005
- Scopus ID
- 2-s2.0-105022976720
- Other Identifier
- 991022065142304721
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- Collaboration types
- Domestic collaboration
- International collaboration
- Web of Science research areas
- Materials Science, Multidisciplinary