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Journal article
Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films
APL materials, v 3(4), 41101
Apr 2015
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
For potential applications in superconducting RF cavities, we have investigated the properties of polycrystalline MgB2 films, including the thickness dependence of the lower critical field Hc1. MgB2 thin films were fabricated by hybrid physical-chemical vapor deposition on (0001) SiC substrate either directly (for epitaxial films) or with a MgO buffer layer (for polycrystalline films). When the film thickness decreased from 300 nm to 100 nm, Hc1 at 5 K increased from around 600 Oe to 1880 Oe in epitaxial films and to 1520 Oe in polycrystalline films. The result is promising for using MgB2/MgO multilayers to enhance the vortex penetration field.
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Details
- Title
- Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films
- Creators
- Teng Tan - Temple UniversityM. A. Wolak - Temple UniversityNarendra Acharya - Temple UniversityAlex Krick - Temple UniversityAndrew C. Lang - Drexel University, Materials Science and EngineeringJennifer Sloppy - Drexel University, Materials Science and EngineeringMitra L. Taheri - Drexel University, Materials Science and EngineeringL. Civale - Los Alamos National LaboratoryKe Chen - Temple UniversityX. X. Xi - Temple University
- Publication Details
- APL materials, v 3(4), 41101
- Publisher
- American Institute of Physics (AIP)
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Mechanical Engineering and Mechanics
- Web of Science ID
- WOS:000353828400004
- Scopus ID
- 2-s2.0-84926467829
- Other Identifier
- 991019173441204721
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- Collaboration types
- Domestic collaboration
- Web of Science research areas
- Materials Science, Multidisciplinary
- Nanoscience & Nanotechnology
- Physics, Applied