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Estimation of dislocation density from precession electron diffraction data using the Nye tensor
Journal article   Open access   Peer reviewed

Estimation of dislocation density from precession electron diffraction data using the Nye tensor

A. C. Leff, C. R. Weinberger and M. L. Taheri
Ultramicroscopy, v 153(C), pp 9-21
01 Jun 2015
DOI: https://doi.org/10.1016/j.ultramic.2015.02.002
PMID: 25697461
url
http://manuscript.elsevier.com/S0304399115000170/pdf/S0304399115000170.pdfView
Published, Version of Record (VoR) Open
url
https://doi.org/10.1016/j.ultramic.2015.02.002View
Published, Version of Record (VoR) Open

Abstract

Microscopy Science & Technology Technology
The Nye tensor offers a means to estimate the geometrically necessary dislocation density of a crystalline sample based on measurements of the orientation changes within individual crystal grains. In this paper, the Nye tensor theory is applied to precession electron diffraction automated crystallographic orientation mapping (PED-ACOM) data acquired using a transmission electron microscope (TEM). The resulting dislocation density values are mapped in order to visualize the dislocation structures present in a quantitative manner. These density maps are compared with other related methods of approximating local strain dependencies in dislocation-based microstructural transitions from orientation data. The effect of acquisition parameters on density measurements is examined. By decreasing the step size and spot size during data acquisition, an increasing fraction of the dislocation content becomes accessible. Finally, the method described herein is applied to the measurement of dislocation emission during in situ annealing of Cu in IBM in order to demonstrate the utility of the technique for characterizing microstructural dynamics. (C) 2015 Elsevier By, All rights reserved.

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