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Experimental assessment of metal solvents for low-temperature liquid-phase epitaxy of silicon carbide
Journal article   Peer reviewed

Experimental assessment of metal solvents for low-temperature liquid-phase epitaxy of silicon carbide

Michael G. Mauk, Bryan W. Feyock, Archana Sharma and Robert G. Hunsperger
Journal of crystal growth, v 225(02-04), pp 322-329
May 2001

Abstract

A3. Liquid phase epitaxy B2. Semiconducting silicon compounds
The results of an experimental survey of metal solvents for low-temperature liquid-phase epitaxy (LPE) of SiC on 6H–SiC substrates is reported. The most promising solvents for low-temperature (900°C–1200°C) LPE include Ga, Sn, Ga/Sn, Ni, Cu, and Zn–Al. We were able to achieve continuous epitaxial layers of several microns thickness at growth temperatures of around 1000°C. In the case of Zn/Al solvents, the growth mechanism is attributed to supersaturation induced by solvent evaporation. Selective epitaxy on patterned, masked SiC substrates was also demonstrated.

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