Guest Editorial Complex Network for Modern Smart Grid Application-Part 2: Stability, Reliability and Resilience Issues

Journal article

Peer reviewed

Herbert Ho-Ching Iu, Chia-Chi Chu, Chika O. Nwankpa and Chai Wah Wu

IEEE journal on emerging and selected topics in circuits and systems, v 7(3), pp 345-348

01 Sep 2017

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Engineering

Engineering, Electrical & Electronic

Science & Technology

Technology

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2 citations in Scopus

Title: Guest Editorial Complex Network for Modern Smart Grid Application-Part 2: Stability, Reliability and Resilience Issues
Creators: Herbert Ho-Ching Iu - The University of Western Australia
Chia-Chi Chu - National Tsing Hua University
Chika O. Nwankpa - Drexel University
Chai Wah Wu - IBM (United States)
Publication Details: IEEE journal on emerging and selected topics in circuits and systems, v 7(3), pp 345-348
Publisher: IEEE
Number of pages: 4
Resource Type: Journal article
Language: English
Web of Science ID: WOS:000410736100001
Scopus ID: 2-s2.0-85029934535
Other Identifier: 991019318938304721

Data related to this publication, from InCites Benchmarking & Analytics tool:

Collaboration types: Industry collaboration; Domestic collaboration; International collaboration
Web of Science research areas: Engineering, Electrical & Electronic