H2O-derived contamination of cleaved Si(111)-2×1 surfaces

Journal article

J. E Demuth, N. J Dinardo and W. A Thompson

Physical review. B, Condensed matter, v 31(2), pp 1130-1132

15 Jan 1985

Additional Links

Condensed matter: electronic structure, electrical, magnetic, and optical properties

Electron and ion emission by liquids and solids; impact phenomena

Exact sciences and technology

Impact phenomena (including electron spectra and sputtering)

Other electron-impact emission phenomena

Physics

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16 citations in Scopus

Title: H2O-derived contamination of cleaved Si(111)-2×1 surfaces
Creators: J. E Demuth - IBM Research - Thomas J. Watson Research Center
N. J Dinardo - IBM Research – Thomas J. Watson Research Center
W. A Thompson - IBM Research - Thomas J. Watson Research Center
Publication Details: Physical review. B, Condensed matter, v 31(2), pp 1130-1132
Publisher: American Physical Society
Resource Type: Journal article
Language: English
Academic Unit: Physics
Web of Science ID: WOS:A1985AAH0100059
Scopus ID: 2-s2.0-0008967241
Other Identifier: 991021862370604721

Data related to this publication, from InCites Benchmarking & Analytics tool:

Web of Science research areas: Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter