Logo image
High resolution switching magnetization magnetic force microscopy
Journal article   Peer reviewed

High resolution switching magnetization magnetic force microscopy

V. Cambel, M. Precner, J. Fedor, J. Soltys, J. Tobik, T. Scepka and G. Karapetrov
Applied physics letters, v 102(6), p62405
11 Feb 2013

Abstract

Physical Sciences Physics Physics, Applied Science & Technology
We introduce switching magnetization magnetic force microscopy based on two-pass scanning atomic force microscopy with reversed tip magnetization between the scans. Within this approach the sum of the scanned data with reversed tip magnetization depicts local van der Waals forces, while their differences map the local magnetic forces. Here we implement this method by fabricating low-momentum magnetic probes that exhibit magnetic single domain state, which can be easily reversed in low external field during the scanning. Measurements on high-density parallel and perpendicular magnetic recording media show enhanced spatial resolution of magnetization. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4791591]

Metrics

7 Record Views
17 citations in Scopus

Details

UN Sustainable Development Goals (SDGs)

This publication has contributed to the advancement of the following goals:

#11 Sustainable Cities and Communities

InCites Highlights

Data related to this publication, from InCites Benchmarking & Analytics tool:

Collaboration types
Domestic collaboration
International collaboration
Web of Science research areas
Physics, Applied
Logo image