- Title
- High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentation
- Creators
- Daibin GeVladislav DomnichYury Gogotsi
- Publication Details
- Journal of applied physics, v 93(5), pp 2418-2423
- Publisher
- American Institute of Physics (AIP)
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Web of Science ID
- WOS:000181307000014
- Scopus ID
- 2-s2.0-0037347946
- Other Identifier
- 991014969863304721
Journal article
High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentation
Journal of applied physics, v 93(5), pp 2418-2423
Mar 2003
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- Web of Science research areas
- Physics, Applied