Journal article
Improved X-ray powder diffraction data for Ti2AlN
Powder diffraction, v 15(4), pp 241-242
Dec 2000
Abstract
A complete set of d spacings, intensities, and h, k, l indexes for Ti2AlN has been determined from X-ray powder diffraction. The lattice parameters are a=2.989(2) Å, c=13.614(5) Å; in good agreement with previous work. The new set of results comprises seven reflections not present in the current Ti2AlN PDF card No. 18-70. Furthermore, a new set of relative intensities are reported that are in better agreement with the calculated values than they are with those listed in the PDF card.
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Details
- Title
- Improved X-ray powder diffraction data for Ti2AlN
- Creators
- M. Y. Gamarnik - Department of Materials Engineering, Drexel University, Philadelphia, Pennsylvania 19104M. W. Barsoum - Drexel UniversityT. El-Raghy - Department of Materials Engineering, Drexel University, Philadelphia, Pennsylvania 19104
- Publication Details
- Powder diffraction, v 15(4), pp 241-242
- Publisher
- Cambridge University Press
- Number of pages
- 2
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Web of Science ID
- WOS:000165854700008
- Scopus ID
- 2-s2.0-0034344634
- Other Identifier
- 991019167723004721
InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Materials Science, Characterization & Testing