In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias

Journal article

Peer reviewed

C Winkler, L Martin, C Johnson and M Taheri

Microscopy and microanalysis, v 15(S2), pp 724-725

Jul 2009

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In-Situ Microscopy: Real Time Correlation of Structure, Processing, and Properties

Instrumentation and Techniques

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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Title: In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias
Creators: C Winkler - Drexel University
L Martin - Lawrence Berkeley National Laboratory
C Johnson - Drexel University
M Taheri - Drexel University
Publication Details: Microscopy and microanalysis, v 15(S2), pp 724-725
Publisher: Cambridge University Press
Number of pages: 2
Resource Type: Journal article
Language: English
Academic Unit: Office of Research (and Innovation); Chemical and Biological Engineering
Web of Science ID: WOS:000208119100359
Scopus ID: 2-s2.0-69949177227
Other Identifier: 991019168653804721

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Collaboration types: Domestic collaboration
Web of Science research areas: Materials Science, Multidisciplinary; Microscopy