In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films

Journal article

Peer reviewed

M. Jablonski, C.R. Winkler, M.L. Taheri, A.R. Damodaran, J. Karthik, J.G. Wen and D.J. Miller

Microscopy and microanalysis, v 18(S2), pp 1462-1463

Jul 2012

PMID: 23191676

Additional Links

Electron Microscopy/Spectroscopy of Energy-Related Materials-13

Physical Science Symposium

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Title: In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films
Creators: M. Jablonski - Drexel University
C.R. Winkler - Drexel University
M.L. Taheri - Drexel University
A.R. Damodaran - University of Illinois Urbana-Champaign
J. Karthik - University of Illinois Urbana-Champaign
J.G. Wen - Argonne National Laboratory
D.J. Miller - Argonne National Laboratory
Publication Details: Microscopy and microanalysis, v 18(S2), pp 1462-1463
Publisher: Cambridge University Press
Number of pages: 2
Resource Type: Journal article
Language: English
Scopus ID: 2-s2.0-85007967899
Other Identifier: 991019335227404721