Logo image
Machine learning for automated experimentation in scanning transmission electron microscopy
Journal article   Open access   Peer reviewed

Machine learning for automated experimentation in scanning transmission electron microscopy

NPJ COMPUTATIONAL MATERIALS, v 9(1), 227
20 Dec 2023
url
https://doi.org/10.1038/s41524-023-01142-0View
Published, Version of Record (VoR)CC BY V4.0 Open

Abstract

Machine learning (ML) has become critical for post-acquisition data analysis in (scanning) transmission electron microscopy, (S)TEM, imaging and spectroscopy. An emerging trend is the transition to real-time analysis and closed-loop microscope operation. The effective use of ML in electron microscopy now requires the development of strategies for microscopy-centric experiment workflow design and optimization. Here, we discuss the associated challenges with the transition to active ML, including sequential data analysis and out-of-distribution drift effects, the requirements for edge operation, local and cloud data storage, and theory in the loop operations. Specifically, we discuss the relative contributions of human scientists and ML agents in the ideation, orchestration, and execution of experimental workflows, as well as the need to develop universal hyper languages that can apply across multiple platforms. These considerations will collectively inform the operationalization of ML in next-generation experimentation.

Metrics

8 Record Views
42 citations in Scopus

Details

UN Sustainable Development Goals (SDGs)

This publication has contributed to the advancement of the following goals:

#3 Good Health and Well-Being

InCites Highlights

Data related to this publication, from InCites Benchmarking & Analytics tool:

Collaboration types
Domestic collaboration
Web of Science research areas
Chemistry, Physical
Materials Science, Multidisciplinary
Logo image