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Magnetic elements for switching magnetization magnetic force microscopy tips
Journal article   Peer reviewed

Magnetic elements for switching magnetization magnetic force microscopy tips

V. Cambel, P. Elias, D. Gregusova, J. Martaus, J. Fedor, G. Karapetrov, V. Novosad and Argonne National Lab. (ANL), Argonne, IL (United States)
Journal of magnetism and magnetic materials, v 322(18), pp 2715-2721
01 Sep 2010

Abstract

Materials Science Materials Science, Multidisciplinary Physical Sciences Physics Physics, Condensed Matter Science & Technology Technology
Using combination of micromagnetic calculations and magnetic force microscopy (MFM) imaging we find optimal parameters for novel magnetic tips suitable for switching magnetization MFM. Switching magnetization MFM is based on two-pass scanning atomic force microscopy with reversed tip magnetization between the scans. Within the technique the sum of the scanned data with reversed tip magnetization depicts local atomic forces. while their difference maps the local magnetic forces. Here we propose the design and calculate the magnetic properties of tips suitable for this scanning probe technique. We find that for best performance the spin-polarized tips must exhibit low magnetic moment, low switching fields, and single-domain state at remanence. The switching field of such tips is calculated and optimum shape of the Permalloy elements for the tips is found. We show excellent correspondence between calculated and experimental results for Py elements. (C) 2010 Elsevier B.V. All rights reserved.

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Collaboration types
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Web of Science research areas
Materials Science, Multidisciplinary
Physics, Condensed Matter
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