Measurements of Surface Residual Stresses in Si3N4 Based Laminates by Raman Spectroscopy

Journal article

Peer reviewed

Nina Orlovskaya, Yu.G. Gogotsi and TTP

Key engineering materials, v 206-213(II), pp 1025-1028

15 Dec 2001

Additional Links

Surface Residual Stress

Raman Spectroscopy

Fracture Toughness

Laminates

Strength

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Title: Measurements of Surface Residual Stresses in Si3N4 Based Laminates by Raman Spectroscopy
Creators: Nina Orlovskaya - Drexel University
Yu.G. Gogotsi - Drexel University
TTP
Publication Details: Key engineering materials, v 206-213(II), pp 1025-1028
Publisher: Trans Tech Publications Ltd
Resource Type: Journal article
Language: English
Academic Unit: Materials Science and Engineering
Web of Science ID: WOS:000172651400250
Other Identifier: 991019167676604721

Data related to this publication, from InCites Benchmarking & Analytics tool:

Web of Science research areas: Materials Science, Ceramics; Materials Science, Composites