Journal article
Mechanism of the flexural resonance frequency shift of a piezoelectric microcantilever sensor in a dc bias electric field
Applied physics letters, v 92(3), pp 033503-033503-3
21 Jan 2008
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Abstract
The flexural resonance frequency of a lead magnesium niobate-lead titanate (PMN-PT)/tin piezoelectric microcantilever sensor (PEMS) was shown to vary in a dc bias electric field, similar to the behavior of width-mode resonance frequency of the PEMS. Both the flexural and the width-mode resonance frequency shifts were attributed to Young's modulus change in the PMN-PT layer as confirmed by Young's modulus measurements on a separate PMN-PT strip. Young's modulus change of the PMN-PT layer in an electric field was a result of the non-180 degrees polarization domain switching as evidenced by the dielectric constant change with the field. (C) 2008 American Institute of Physics.
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Details
- Title
- Mechanism of the flexural resonance frequency shift of a piezoelectric microcantilever sensor in a dc bias electric field
- Creators
- Qing Zhu - Drexel Univ, Dept Mat Sci & Engn, Sch Biomed Engn Sci & Hlth Syst, Philadelphia, PA 19104 USAWan Y. Shih - Drexel UniversityWei-Heng Shih - Drexel University
- Publication Details
- Applied physics letters, v 92(3), pp 033503-033503-3
- Publisher
- American Institute of Physics
- Number of pages
- 3
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- School of Biomedical Engineering, Science, and Health Systems; Materials Science and Engineering
- Web of Science ID
- WOS:000252718600071
- Other Identifier
- 991019167597104721
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- Web of Science research areas
- Physics, Applied