Journal article
Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging
Small (Weinheim an der Bergstrasse, Germany), v 8(8), pp 1264-1269
23 Apr 2012
PMID: 22334564
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
The cantilever dynamics in single-frequency scanning probe microscopy (SPM) are undefined due to having only two output variables, which leads to poorly understood image contrast. To address this shortcoming, generalized phase imaging scanning probe microscopy (GP-SPM), based on broad band detection and multi-eigenmode operation, is developed and demonstrated on diamond nanoparticles with different functionalization layers. It is shown that rich information on tip-surface interactions can be acquired by separating the response amplitude, instant resonance frequency, and quality factor. The obtained data allow high-resolution imaging even in the ambient environment. By tuning the strength of tip-surface interaction, different surface functionalizations can be discerned.
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Details
- Title
- Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging
- Creators
- Senli Guo - The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USASantiago D SolaresVadym MochalinIoannis NeitzelYury GogotsiSergei V KalininStephen Jesse
- Publication Details
- Small (Weinheim an der Bergstrasse, Germany), v 8(8), pp 1264-1269
- Publisher
- Wiley; Germany
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Web of Science ID
- WOS:000302800000018
- Scopus ID
- 2-s2.0-84859837350
- Other Identifier
- 991014969866104721
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InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Collaboration types
- Domestic collaboration
- Web of Science research areas
- Chemistry, Multidisciplinary
- Chemistry, Physical
- Materials Science, Multidisciplinary
- Nanoscience & Nanotechnology
- Physics, Applied
- Physics, Condensed Matter