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Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging
Journal article   Peer reviewed

Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging

Senli Guo, Santiago D Solares, Vadym Mochalin, Ioannis Neitzel, Yury Gogotsi, Sergei V Kalinin and Stephen Jesse
Small (Weinheim an der Bergstrasse, Germany), v 8(8), pp 1264-1269
23 Apr 2012
PMID: 22334564

Abstract

Microscopy, Scanning Probe - methods Microscopy, Atomic Force - methods
The cantilever dynamics in single-frequency scanning probe microscopy (SPM) are undefined due to having only two output variables, which leads to poorly understood image contrast. To address this shortcoming, generalized phase imaging scanning probe microscopy (GP-SPM), based on broad band detection and multi-eigenmode operation, is developed and demonstrated on diamond nanoparticles with different functionalization layers. It is shown that rich information on tip-surface interactions can be acquired by separating the response amplitude, instant resonance frequency, and quality factor. The obtained data allow high-resolution imaging even in the ambient environment. By tuning the strength of tip-surface interaction, different surface functionalizations can be discerned.

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28 citations in Scopus

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Collaboration types
Domestic collaboration
Web of Science research areas
Chemistry, Multidisciplinary
Chemistry, Physical
Materials Science, Multidisciplinary
Nanoscience & Nanotechnology
Physics, Applied
Physics, Condensed Matter
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