Journal article
Nanoscale Indentation of Polymer Systems Using the Atomic Force Microscope
The Journal of adhesion, v 64(1-4)
01 Aug 1997
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4-150 N m were used to investigate a number of polymer systems, including an elastomer, several polyurethane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite.
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Details
- Title
- Nanoscale Indentation of Polymer Systems Using the Atomic Force Microscope
- Creators
- M. R. Vanlandingham - University of DelawareS. H. McKnight - United States Army Research LaboratoryG. R. Palmese - University of DelawareJ. R. Elings - Digital Instruments , Santa Barbara, CA, 93103, USAX. Huang - University of DelawareT. A. Bogetti - United States Army Research LaboratoryR. F. Eduljee - University of DelawareJ. W. Gillespie - University of Delaware
- Publication Details
- The Journal of adhesion, v 64(1-4)
- Publisher
- Taylor & Francis Group
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Chemical and Biological Engineering
- Web of Science ID
- WOS:000072355600003
- Scopus ID
- 2-s2.0-0031382202
- Other Identifier
- 991019201512304721
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InCites Highlights
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- Collaboration types
- Domestic collaboration
- Web of Science research areas
- Engineering, Chemical
- Materials Science, Multidisciplinary
- Mechanics