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Nanoscale Indentation of Polymer Systems Using the Atomic Force Microscope
Journal article   Peer reviewed

Nanoscale Indentation of Polymer Systems Using the Atomic Force Microscope

M. R. Vanlandingham, S. H. McKnight, G. R. Palmese, J. R. Elings, X. Huang, T. A. Bogetti, R. F. Eduljee and J. W. Gillespie
The Journal of adhesion, v 64(1-4)
01 Aug 1997

Abstract

Atomic force microscope elastic modulus elastomer epoxy fiber-reinforced polymer composite force curves indentation interphase regions polymers polyurethane
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4-150 N m were used to investigate a number of polymer systems, including an elastomer, several polyurethane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite.

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Collaboration types
Domestic collaboration
Web of Science research areas
Engineering, Chemical
Materials Science, Multidisciplinary
Mechanics
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