Journal article
Numerical computation of the complex dielectric permittivity using Hilbert transform and FFT techniques
Journal of the Franklin Institute, v 336(1)
1999
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
A procedure is described to efficiently obtain the complex dielectric permittivity of semiconductor materials with numerical routines available in current software applications. This procedure calculates the real component of the dielectric permittivity from its imaginary component by making use of the Hilbert transform properties of the Kramers–Kronig relations. We show the reliability of this approach by reconstructing the real component from the experimentally known dispersion relations of GaAs and InAs. In addition, we use this procedure for the case when the imaginary component is obtained from analytical expressions as is the case for the Franz–Keldysh effect in the absorption of photons in GaAs. We show how the spectral photoreflection of structures where this effect is present can be easily modeled and simulated by this method.
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Details
- Title
- Numerical computation of the complex dielectric permittivity using Hilbert transform and FFT techniques
- Creators
- Francisco Castro - Drexel UniversityBahram Nabet - Drexel University
- Publication Details
- Journal of the Franklin Institute, v 336(1)
- Publisher
- Elsevier
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Electrical and Computer Engineering
- Web of Science ID
- WOS:000077472900006
- Scopus ID
- 2-s2.0-0032735593
- Other Identifier
- 991019168900404721
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InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Automation & Control Systems
- Engineering, Electrical & Electronic
- Engineering, Multidisciplinary
- Mathematics, Interdisciplinary Applications