- Title
- Quantitative Aberration-Corrected STEM for Studies of Oxide Superlattices and Topological Defects in Layered Ferroelectrics
- Creators
- Albina Borisevich - Oak Ridge National LaboratoryRama Vasudevan - Oak Ridge National LaboratoryYu Zhou - Drexel UniversityKyle Kelley - Oak Ridge National LaboratoryDonovan Leonard - Oak Ridge National LaboratorySummayya Kouser - Vanderbilt UniversitySabine Neumayer - Oak Ridge National LaboratoryPeter Maksymovych - 1Oak Ridge National Laboratory, Oak Ridge, Tennessee, United StatesSokrates Pantelides - Vanderbilt UniversitySteven May - Drexel UniversityNina Balke - Oak Ridge National Laboratory
- Publication Details
- Microscopy and microanalysis, v 26(S2), pp 1194-1195
- Publisher
- Cambridge University Press
- Number of pages
- 2
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Scopus ID
- 2-s2.0-85214066423
- Other Identifier
- 991021934114204721
Journal article
Quantitative Aberration-Corrected STEM for Studies of Oxide Superlattices and Topological Defects in Layered Ferroelectrics
Microscopy and microanalysis, v 26(S2), pp 1194-1195
01 Aug 2020
Abstract
Metrics
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