Journal article
Relating Polymer Indentation Behavior to Elastic Modulus Using Atomic Force Microscopy
MRS proceedings, v 440
1996
Abstract
The atomic force microscope (AFM) has become a popular tool for characterizing surfaces of many different types of materials. In this paper, an AFM is used to probe the mechanical properties of polymer samples through examination of force curves produced during tip-sample contact and indentation. Three types of cantilever probes with spring constants estimated to be 1–5 N/m, 20–100 N/m, and 400–500 N/m respectively, were used to study different polymer samples with known modulus values ranging from 20 MPa to 3 GPa. A technique is developed that relates the measured sample response to elastic modulus, and illuminates the importance of the relative stiffnesses of the cantilever probe and the sample to the material response.
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Details
- Title
- Relating Polymer Indentation Behavior to Elastic Modulus Using Atomic Force Microscopy
- Creators
- M. R. Vanlandingham - University of DelawareS. H. Mcknight - United States Army Research LaboratoryG. R. Palmese - University of DelawareR. F. Eduljee - University of DelawareJ. W. Gillespie - University of DelawareR. L. Mccullough - University of Delaware
- Contributors
- R.C. Cammarata (Editor)E.H. Chason (Editor)T.L. Einstein (Editor)E.D. Williams (Editor)
- Publication Details
- MRS proceedings, v 440
- Publisher
- Cambridge University Press
- Number of pages
- 6
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Chemical and Biological Engineering
- Other Identifier
- 991019201361604721