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Rendering Ti3C2Tx (MXene) monolayers visible
Journal article   Open access

Rendering Ti3C2Tx (MXene) monolayers visible

A. Miranda, J. Halim, A. Lorke and M. W. Barsoum
Materials research letters, v 5(5), pp 322-328
01 Jan 2017
url
https://doi.org/10.1080/21663831.2017.1280707View
Published, Version of Record (VoR)CC BY V4.0 Open

Abstract

Materials Science Materials Science, Multidisciplinary Science & Technology Technology
Herein we report on how to render Ti3C2Tx (MXene) monolayers deposited on SiO2/Si wafers, with different SiO2 thicknesses, visible. Inputting the effective thickness of a Ti(3)C(2)Tx monolayer (1 +/- 0.2 nm) measured by atomic force microscopy, and its refractive index into a Fresnel-law-based simulation software, we show that the optical contrast of Ti(3)C(2)Tx monolayers deposited on SiO2/Si wafers depends on the SiO2 thickness, number of MXene layers, and the light's wavelength. The highest contrast was found for SiO2 thicknesses around 220 nm. Simulations for other substrates, namely, Al2O3/Si, HfO2/Si, Si3N4/Si and Al2O3/Al, are presented as supplementary information. [GRAPHICS] .

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Web of Science research areas
Materials Science, Multidisciplinary
Metallurgy & Metallurgical Engineering
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