Journal article
Spectral histogram using the minimization algorithm-theory and applications to flaw detection
IEEE transactions on ultrasonics, ferroelectrics, and frequency control, v 39(2), pp 279-284
Mar 1992
PMID: 18263148
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
In ultrasonic flaw detection in large grained materials, backscattered grain noise often masks the flaw signal. To enhance the flaw visibility, a frequency diverse statistical filtering technique known as split-spectrum processing has been developed. This technique splits the received wideband signal into an ensemble of narrowband signals exhibiting different signal-to-noise ratios (SNR). Using a minimization algorithm, SNR enhancement can be obtained at the output. The nonlinear properties of the frequency diverse statistic filter are characterized based on the spectral histogram, which is the statistical distribution of the spectral windows selected by the minimization algorithm. The theoretical analysis indicates that the spectral histogram is similar in nature to the Wiener filter transfer function. Therefore, the optimal filter frequency region can be determined adaptively based on the spectral histogram without prior knowledge of the signal and noise spectra.< >
Metrics
Details
- Title
- Spectral histogram using the minimization algorithm-theory and applications to flaw detection
- Creators
- X Li - Drexel UniversityN.M Bilgutay - Drexel UniversityR Murthy - Drexel University
- Publication Details
- IEEE transactions on ultrasonics, ferroelectrics, and frequency control, v 39(2), pp 279-284
- Publisher
- IEEE
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Web of Science ID
- WOS:A1992HV42300017
- Scopus ID
- 2-s2.0-0026835306
- Other Identifier
- 991019173557404721
UN Sustainable Development Goals (SDGs)
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InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Acoustics
- Engineering, Electrical & Electronic