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Structure of Ti 4AlN 3—a layered M n+1AX n nitride
Journal article   Peer reviewed

Structure of Ti 4AlN 3—a layered M n+1AX n nitride

C.J Rawn, M.W Barsoum, T El-Raghy, A Procipio, C.M Hoffmann and C.R Hubbard
Materials research bulletin, v 35(11), pp 1785-1796
2000
DOI: https://doi.org/10.1016/S0025-5408(00)00383-4

Abstract

A. Nitrides C. Neutron scattering C. X-ray diffraction (XRD) D. Crystal structure
Recent high resolution transmission electron microscopy and electron probe X-ray microanalysis show that the compound originally thought to be Ti 3Al 2N 2 is Ti 4AlN 3. In this paper we report on the crystal structure determination by Rietveld refinement on neutron and X-ray powder diffraction data. Ti 4AlN 3 crystallizes with a hexagonal unit cell, space group P6 3/ mmc, and with lattice parameters a = 2.9880(2) and c = 23.372(2) Å. The stacking sequence is such that every four layers of Ti atoms is separated by a layer of Al atoms. The N atoms occupy octahedral sites between the Ti atoms making up a network of corner shared octahedra. This compound is closely related to other layered, ternary, machinable, hexagonal nitrides and carbides, namely, M2AX and M3AX2, where M is an early transition metal, A is a A-group element and X is either C and/or N.

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Domestic collaboration
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Materials Science, Multidisciplinary
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