Journal article
Symposium on Ultrafast Electron Microscopy and Ultrafast Science
Microscopy and microanalysis, v 15(4), pp 271-271
03 Jul 2009
PMID: 19575827
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
Dynamic characterization techniques have been utilized in the fields of biology, chemistry, physics, and materials science for many years. Techniques range from neutron scattering to X-ray diffraction. Two of the fields experiencing much development recently have been electron-based techniques. Namely, ultrafast electron diffraction (UED) and ultrafast electron microscopy (UEM) have been advancing rapidly, but unfortunately, in parallel. We are approaching an era where the convergence of these two techniques could open up a wide range of scientific and technological opportunities and advancements.
Metrics
Details
- Title
- Symposium on Ultrafast Electron Microscopy and Ultrafast Science
- Creators
- Mitra L. Taheri - Drexel UniversityNigel D. Browning - Lawrence Livermore National LaboratoryJohn Lewellen - Naval Postgraduate School
- Publication Details
- Microscopy and microanalysis, v 15(4), pp 271-271
- Publisher
- Cambridge University Press
- Number of pages
- 1
- Resource Type
- Journal article
- Language
- English
- Web of Science ID
- WOS:000268422000001
- Scopus ID
- 2-s2.0-69149102633
- Other Identifier
- 991019330617004721
UN Sustainable Development Goals (SDGs)
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InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Collaboration types
- Domestic collaboration
- Web of Science research areas
- Materials Science, Multidisciplinary
- Microscopy