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Synthesis and characterization of Nb2AlC thin films
Journal article   Peer reviewed

Synthesis and characterization of Nb2AlC thin films

T. H. Scabarozi, J. Roche, A. Rosenfeld, S. H. Lim, L. Salamanca-Riba, G. Yong, I. Takeuchi, M. W. Barsoum, J. D. Hettinger and S. E. Lofland
Thin solid films, v 517(9), pp 2920-2923
02 Mar 2009
DOI: https://doi.org/10.1016/j.tsf.2008.12.047

Abstract

Materials Science Materials Science, Coatings & Films Materials Science, Multidisciplinary Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology Technology
We report on the synthesis and characterization of epitaxial c-axis oriented Nb2AlC thin films deposited on c-axis sapphire (Al2O3) substrates by magnetron sputtering. Selected area electron diffraction reveal that independent of substrate temperature or film stoichiometry, there is the growth of a secondary phase not found in bulk, Nb5Al3Cx with a- and c-axis lattice constants of 7.746 angstrom and 5.246 angstrom, respectively. Scanning electron micrographs reveal large surface features, many with hexagonal shape and faceted texture. Atomic force microscopy topographical measurements indicate a surface roughness of approximately 15% of the total film thickness. Electrical transport measurements show typical metal-like conduction with a room temperature resistivity of approximate to 0.9 mu Omega-m and a residual resistivity ratio of 2.5. A superconducting transition was found at approximate to 440 mK. (C) 2009 Elsevier B.V. All rights reserved.

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Domestic collaboration
Web of Science research areas
Materials Science, Coatings & Films
Materials Science, Multidisciplinary
Physics, Applied
Physics, Condensed Matter
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