Journal article
The {110} reflection in X‐ray diffraction of MXene films: Misinterpretation and measurement via non‐standard orientation
Journal of the American Ceramic Society, v 100(12), pp 5395-5399
Dec 2017
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Abstract
It has been claimed that disappearance of the {110} reflection in powder X‐ray diffraction of MXene films and powders is indicative of shearing or general disorder of restacking of the flakes. Here we show this to be incorrect and provide experimental justification. The disappearance of this peak arises from a combination of sample texture and orientation. Furthermore, our methods provide a simple way to estimate a unit cell parameters when the relevant reflections are not present in most reports of MXene films.
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Details
- Title
- The {110} reflection in X‐ray diffraction of MXene films: Misinterpretation and measurement via non‐standard orientation
- Creators
- Michael Ghidiu - Drexel UniversityMichel W. Barsoum - Drexel University
- Publication Details
- Journal of the American Ceramic Society, v 100(12), pp 5395-5399
- Publisher
- Wiley
- Number of pages
- 5
- Grant note
- U.S. National Science Foundation (DMR‐1310245) U.S. National Science Foundation Graduate Research Fellowship Program (283036‐3304)
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Web of Science ID
- WOS:000412844200009
- Scopus ID
- 2-s2.0-85027731257
- Other Identifier
- 991019167817904721
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- Web of Science research areas
- Materials Science, Ceramics