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The Design of Truncated Sequential Test Plans Based on Attributes Data
Journal article   Peer reviewed

The Design of Truncated Sequential Test Plans Based on Attributes Data

Thomas P. McWilliams
Communications in statistics. Simulation and computation, v 33(3), pp 843-859
02 Jan 2004

Abstract

Binomial test Poisson test Primary 62L05 Secondary 62F03 Sequential test
This study investigates the effect of the choice of a truncation strategy on sequential test plan performance for test plans based on attributes data. We present numerical results that demonstrate the effect of varying the truncation sample size m and reject value R for plans having essentially equivalent Type I and Type II error probabilities. The results show that the choice of m and R should not be taken lightly, as both parameters have a significant effect on test performance.

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Statistics & Probability
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