Journal article
Ultrasound Exposimetry: An Essential Component of Ultrasonic Device Characterization
IEEE transactions on ultrasonics, ferroelectrics, and frequency control, v 70(2), p82
01 Jan 2023
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
In 1988, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control (TUFFC) hosted a Special Issue on Ultrasound Exposimetry (vol. 35, no. 2). This issue is now recognized as seminal; it laid the groundwork for the development of numerous domestic and international standards that are still widely used for calibration and regulatory characterization of ultrasound devices. Since then, medical ultrasound has undergone significant expansion, and the time is right for a sequel. The Guest Editors are delighted to present nine contributions to this Spotlight Issue on Advances in Ultrasound Exposimetry.
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Details
- Title
- Ultrasound Exposimetry: An Essential Component of Ultrasonic Device Characterization
- Creators
- Peter Lewin - Drexel UniversityKeith Wear - Center for Devices and Radiological Health
- Publication Details
- IEEE transactions on ultrasonics, ferroelectrics, and frequency control, v 70(2), p82
- Publisher
- The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- School of Biomedical Engineering, Science, and Health Systems
- Web of Science ID
- WOS:000935005300001
- Scopus ID
- 2-s2.0-85148486566
- Other Identifier
- 991020072356804721
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InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Collaboration types
- Domestic collaboration
- Web of Science research areas
- Acoustics
- Engineering, Electrical & Electronic