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Ultrasound Exposimetry: An Essential Component of Ultrasonic Device Characterization
Journal article   Open access   Peer reviewed

Ultrasound Exposimetry: An Essential Component of Ultrasonic Device Characterization

Peter Lewin and Keith Wear
IEEE transactions on ultrasonics, ferroelectrics, and frequency control, v 70(2), p82
01 Jan 2023
url
https://doi.org/10.1109/tuffc.2023.3235506View
Published, Version of Record (VoR)Maybe Open Access (Publisher Bronze) Open
url
https://doi.org/10.1109/TUFFC.2023.3235506View
Published, Version of Record (VoR) Open

Abstract

Exposure Ferroelectric materials Ferroelectricity Frequency control
In 1988, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control (TUFFC) hosted a Special Issue on Ultrasound Exposimetry (vol. 35, no. 2). This issue is now recognized as seminal; it laid the groundwork for the development of numerous domestic and international standards that are still widely used for calibration and regulatory characterization of ultrasound devices. Since then, medical ultrasound has undergone significant expansion, and the time is right for a sequel. The Guest Editors are delighted to present nine contributions to this Spotlight Issue on Advances in Ultrasound Exposimetry.

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Collaboration types
Domestic collaboration
Web of Science research areas
Acoustics
Engineering, Electrical & Electronic
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