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Ultrathin atomic layer deposited niobium oxide as a passivation layer in silicon based photovoltaics
Journal article   Open access   Peer reviewed

Ultrathin atomic layer deposited niobium oxide as a passivation layer in silicon based photovoltaics

Connor J. Leach, Benjamin E. Davis, Ben M. Garland, Ryan Thorpe and Nicholas C. Strandwitz
Journal of applied physics, v 130(21), 215301
07 Dec 2021
url
https://doi.org/10.1063/5.0067281View
Published, Version of Record (VoR) Open

Abstract

Physical Sciences Physics Physics, Applied Science & Technology

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2 citations in Scopus

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UN Sustainable Development Goals (SDGs)

This publication has contributed to the advancement of the following goals:

#7 Affordable and Clean Energy

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Web of Science research areas
Physics, Applied
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