Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

Journal article

Peer reviewed

Y. Kim, A. Kumar, I. Ivanov, A. Tselev, M.D. Biegalski, S.J. Pennycook, S.V. Kalinin, A.Y. Borisevich, A. Hatt, A. Morozovska, …

Microscopy and microanalysis, v 18(S2), pp 412-413

Jul 2012

PMID: 23191151

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Applications of Aberration-Corrected STEM and SEM-09

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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Title: Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect
Creators: Y. Kim - Oak Ridge National Laboratory
A. Kumar - Oak Ridge National Laboratory
I. Ivanov - Oak Ridge National Laboratory
A. Tselev - Oak Ridge National Laboratory
M.D. Biegalski - Oak Ridge National Laboratory
S.J. Pennycook - Oak Ridge National Laboratory
S.V. Kalinin - Oak Ridge National Laboratory
A.Y. Borisevich - Oak Ridge National Laboratory
A. Hatt - Lawrence Berkeley National Laboratory
A. Morozovska - National Academy of Sciences of Ukraine,
E. Eliseev - National Yang Ming Chiao Tung University
Y. Chu - National Yang Ming Chiao Tung University
P. Yu - University of California, Berkeley
R. Ramesh - University of California, Berkeley
J. Rondinelli - Drexel University
Publication Details: Microscopy and microanalysis, v 18(S2), pp 412-413
Publisher: Cambridge University Press
Number of pages: 2
Resource Type: Journal article
Language: English
Scopus ID: 2-s2.0-85007947186
Other Identifier: 991019335512804721