X-Ray Microcomputed Tomography for Analysis of Retrieved Medical Devices

Journal article

Open access

Peer reviewed

Judd S Day, Daniel W Macdonald and Steven M Kurtz

Microscopy and microanalysis, v 21(S3), pp 449-450

Aug 2015

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url

https://doi.org/10.1017/s1431927615003049View

Published, Version of Record (VoR)Maybe Open Access (Publisher Bronze), Open

url

https://doi.org/10.1017/S1431927615003049View

Published, Version of Record (VoR) Open

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

Physical Science Symposia

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Title: X-Ray Microcomputed Tomography for Analysis of Retrieved Medical Devices
Creators: Judd S Day - Exponent, Inc., Philadelphia, PA, USA
Daniel W Macdonald - Drexel University
Steven M Kurtz - Exponent (United States)
Publication Details: Microscopy and microanalysis, v 21(S3), pp 449-450
Publisher: Cambridge University Press
Number of pages: 2
Resource Type: Journal article
Language: English
Academic Unit: College of Medicine; School of Biomedical Engineering, Science, and Health Systems
Other Identifier: 991019189055004721