- Title
- X-ray absorption spectroscopy, EELS, and full-potential augmented plane wave study of the electronic structure of Ti 2 Al C , Ti 2 Al N , Nb 2 Al C , and ( Ti 0.5 Nb 0.5 ) 2 Al C
- Creators
- G. Hug - Laboratoire d'Étude des MicrostructuresM. Jaouen - University of PoitiersM. W. Barsoum - Université de Poitiers
- Publication Details
- Physical review. B, Condensed matter and materials physics, v 71(2)
- Publisher
- Cold Spring Harbor Press
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering
- Web of Science ID
- WOS:000226735400021
- Scopus ID
- 2-s2.0-16844373135
- Other Identifier
- 991019167625304721
Journal article
X-ray absorption spectroscopy, EELS, and full-potential augmented plane wave study of the electronic structure of Ti 2 Al C , Ti 2 Al N , Nb 2 Al C , and ( Ti 0.5 Nb 0.5 ) 2 Al C
Physical review. B, Condensed matter and materials physics, v 71(2)
Jan 2005
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- Collaboration types
- Domestic collaboration
- International collaboration
- Web of Science research areas
- Materials Science, Multidisciplinary
- Physics, Applied
- Physics, Condensed Matter