Journal article
Employing time-resolved terahertz spectroscopy to analyze carrier dynamics in thin-film Cu2ZnSn(S,Se)(4) absorber layers
Applied physics letters, v 104(25)
23 Jun 2014
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
We report the application of time-resolved terahertz spectroscopy (TRTS) to measure photoexcited carrier lifetimes and mobility, and to determine recombination mechanisms in Cu2ZnSn(S,Se)(4) (CZTSSe) thin films fabricated from nanocrystal inks. Ultrafast time resolution permits tracking the evolution of carrier density to determine recombination rates and mechanisms. The carrier generation profile was manipulated by varying the photoexcitation wavelength and fluence to distinguish between surface, Shockley-Read-Hall (SRH), radiative, and Auger recombination mechanisms and determine rate constants. Surface and SRH recombination are the dominant mechanisms for the air/CZTSSe/SiO2/Si film stack. Diffusion to, and then recombination at, the air-CZTSSe interface occurred on the order of 100 picoseconds, while SRH recombination lifetimes were 1-2 nanoseconds. TRTS measurements can provide information that is complementary to conventional time-resolved photoluminescence measurements and can direct the design of efficient thin film photovoltaics. (C) 2014 AIP Publishing LLC.
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Details
- Title
- Employing time-resolved terahertz spectroscopy to analyze carrier dynamics in thin-film Cu2ZnSn(S,Se)(4) absorber layers
- Creators
- Glenn W. Guglietta - Drexel Univ, Dept Chem & Biol Engn, Philadelphia, PA 19104 USAKaushik Roy Choudhury - DuPont Cent Res & Dev, Expt Stn, Wilmington, DE 19880 USAJonathan V. Caspar - DuPont Cent Res & Dev, Expt Stn, Wilmington, DE 19880 USAJason B. Baxter - Drexel University
- Publication Details
- Applied physics letters, v 104(25)
- Publisher
- American Institute of Physics
- Number of pages
- 5
- Grant note
- P200A100117 / U.S. Department of Education, GAANN for Renewable Energy Technologies and Infrastructure Networks (RETAIN) 1201957 / Div Of Electrical, Commun & Cyber Sys; National Science Foundation (NSF); NSF - Directorate for Engineering (ENG) DMR-0922929 / NSF MRI; National Science Foundation (NSF); NSF - Office of the Director (OD) ECCS-1201957; CBET-1333649 / National Science Foundation; National Science Foundation (NSF)
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Chemical and Biological Engineering
- Web of Science ID
- WOS:000338515900098
- Scopus ID
- 2-s2.0-84979202556
- Other Identifier
- 991019168422004721
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- Collaboration types
- Industry collaboration
- Domestic collaboration
- Web of Science research areas
- Physics, Applied