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Growth and In Situ Characterization of Oxide Epitaxial Heterostructures with Atomic Plane Precision
Journal article   Open access   Peer reviewed

Growth and In Situ Characterization of Oxide Epitaxial Heterostructures with Atomic Plane Precision

Q. He, S. Jesse, A.R. Lupini, M. Fuentes-Cabrera, B.G. Sumpter, A. Akbashev, M. Falmbigl, J. Spanier, S. V. Kalinin and A.Y. Borisevich
Microscopy and microanalysis, v 22(S3), pp 1504-1505
Jul 2016
url
https://doi.org/10.1017/s1431927616008369View
Published, Version of Record (VoR)Maybe Open Access (Publisher Bronze) Open
url
https://doi.org/10.1017/S1431927616008369View
Published, Version of Record (VoR) Open

Abstract

Microscopy for Thin Films of Metals, Semiconductors and Insulators Physical Science Symposia

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