Journal article
Infrared Reflection Spectroscopy and Effective Medium Modeling of As-Anodized and Oxidized Porous Silicon Carbide
Journal of porous materials, v 7(1), pp 139-142
Jan 2000
Abstract
We present a study of the infrared reflectance of porous silicon carbide (PSC) formed by the electrochemical dissolution of silicon carbide substrates of both 6H and 4H polytypes. The reflectance from n-PSC, both as-anodized and passivated, is reported for the first time. The passivation of PSC has been accomplished using a short thermal oxidation. Fourier transform infrared (FTIR) reflectance spectroscopy is employed ex situ after different stages of the thermal oxidation process. The characteristics of the reststrahlen band normally observed in bulk SiC are altered by anodization; further changes in the reflectance spectra occur following oxidation for different periods of time. An effective medium theory model that includes air, SiC and SiO2 as component materials is shown to characterize the observed changes in the reflectance spectra after different stages of PSC oxidation.
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Details
- Title
- Infrared Reflection Spectroscopy and Effective Medium Modeling of As-Anodized and Oxidized Porous Silicon Carbide
- Creators
- Jonathan Spanier - Department of Applied Physics, Columbia Radiation Laboratory Columbia University New York, NY 10027 USAIrving Herman - Department of Applied Physics, Columbia Radiation Laboratory Columbia University New York, NY 10027 USA
- Publication Details
- Journal of porous materials, v 7(1), pp 139-142
- Publisher
- Kluwer Academic Publishers; Boston
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Mechanical Engineering and Mechanics
- Web of Science ID
- WOS:000084254200028
- Scopus ID
- 2-s2.0-0033888054
- Other Identifier
- 991014878471604721
InCites Highlights
Data related to this publication, from InCites Benchmarking & Analytics tool:
- Web of Science research areas
- Chemistry, Applied
- Chemistry, Physical
- Materials Science, Multidisciplinary