Journal article
The Optical Dielectric Function in Monolithic BaxSr1-xTiO3 Films
Integrated ferroelectrics, v 111
01 Jan 2009
Featured in Collection : UN Sustainable Development Goals @ Drexel
Abstract
We present the results of characterization and analysis of the optical dielectric function of monolithic BaxSr1-xTiO3 films prepared by metal-organic solution deposition (MOSD). Lorentz Oscillator + Drude parameters and band gap for selected compositions are determined from variable-angle spectroscopic ellipsometry. Variation of the complex optical dielectric function is seen, and the results suggest that spectroscopic ellipsometry can be an effective means of both ex situ analysis and in situ monitoring of film composition during other BST and related film material growth processes.
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Details
- Title
- The Optical Dielectric Function in Monolithic BaxSr1-xTiO3 Films
- Creators
- D. Bruzzese - Drexel UniversityK. J. Fahnestock - Drexel UniversityC. L. Schauer - Drexel UniversityJ. E. Spanier - Drexel UniversityC. V. Weiss - University of ConnecticutS. P. Alpay - University of ConnecticutM. W. Cole - United States Army Research LaboratoryN. M. Sbrockey - Structured Materials IndustriesG. S. Tompa - Structured Materials Industries
- Publication Details
- Integrated ferroelectrics, v 111
- Publisher
- Taylor & Francis
- Number of pages
- 10
- Grant note
- CMMI-0804543 / NSF; National Science Foundation (NSF) W911NF-08-C-0124; W911NF-08-1-0067 / Army Research Office
- Resource Type
- Journal article
- Language
- English
- Academic Unit
- Materials Science and Engineering; Mechanical Engineering and Mechanics
- Web of Science ID
- WOS:000276194100004
- Scopus ID
- 2-s2.0-84858017446
- Other Identifier
- 991019168750704721
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- Collaboration types
- Domestic collaboration
- Web of Science research areas
- Engineering, Electrical & Electronic
- Physics, Applied
- Physics, Condensed Matter