Logo image
The Optical Dielectric Function in Monolithic BaxSr1-xTiO3 Films
Journal article   Peer reviewed

The Optical Dielectric Function in Monolithic BaxSr1-xTiO3 Films

D. Bruzzese, K. J. Fahnestock, C. L. Schauer, J. E. Spanier, C. V. Weiss, S. P. Alpay, M. W. Cole, N. M. Sbrockey and G. S. Tompa
Integrated ferroelectrics, v 111
01 Jan 2009

Abstract

Engineering Engineering, Electrical & Electronic Physical Sciences Physics Physics, Applied Physics, Condensed Matter Science & Technology Technology
We present the results of characterization and analysis of the optical dielectric function of monolithic BaxSr1-xTiO3 films prepared by metal-organic solution deposition (MOSD). Lorentz Oscillator + Drude parameters and band gap for selected compositions are determined from variable-angle spectroscopic ellipsometry. Variation of the complex optical dielectric function is seen, and the results suggest that spectroscopic ellipsometry can be an effective means of both ex situ analysis and in situ monitoring of film composition during other BST and related film material growth processes.

Metrics

Details

UN Sustainable Development Goals (SDGs)

This publication has contributed to the advancement of the following goals:

#7 Affordable and Clean Energy

InCites Highlights

Data related to this publication, from InCites Benchmarking & Analytics tool:

Collaboration types
Domestic collaboration
Web of Science research areas
Engineering, Electrical & Electronic
Physics, Applied
Physics, Condensed Matter
Logo image